[PDF.32ks] An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

[PDF.yn87] An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)

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 | #4339080 in Books |  imusti |  2015-10-16 | Original language:English | PDF # 1 |  10.00 x.18 x7.01l,.40 | File type: PDF | 66 pages

 | Morgan Claypool

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were fi...

You easily download any file type for your gadget.An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)   |  Sarah Fearn. Just read it with an open mind because none of us really know.

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