[PDF.28vr] Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics)

Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics)

[PDF.uu44] Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics)

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 | #12678042 in Books |  Yoshio Waseda |  2002-10-03 | Original language:English | PDF # 1 |  9.21 x.56 x6.14l,1.11 | File type: PDF | 214 pages

 | Anomalous X Ray Scattering for Materials Characterization

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The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic ...

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