[PDF.19bl] Applied Scanning Probe Methods I (NanoScience and Technology) (v. 1)

Applied Scanning Probe Methods I (NanoScience and Technology) (v. 1)

[PDF.pe61] Applied Scanning Probe Methods I (NanoScience and Technology) (v. 1)

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 | #14566647 in Books |  Springer |  2004-03-05 | Original language:English | PDF # 1 |  9.21 x1.06 x6.14l,1.10 | File type: PDF | 476 pages

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Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology an...

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