[PDF.42ln] Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
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Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
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[PDF.dh08] Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
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| #14485221 in Books | 2010-11-23 | 2010-11-22 | Original language:English | PDF # 1 | 9.00 x.64 x6.00l,.0 | File type: PDF | 224 pages|
This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications.
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