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Defect analysis in electron microscopy
M. H Loretto
[PDF.qb06] Defect analysis in electron microscopy
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| #9847766 in Books | 1975 | Format: Import | PDF # 1 | File type: PDF | 134 pages||0 of 0 people found the following review helpful.| Defect analysis using TEM diffraction contrast techniques|By Ulfilas|In a world where textbooks try to address a multitude of diverse topics, this book stands alone. To the point and focused, this book directs the reader to the most essential tasks in TEM-based dislocation and stacking fault analysis. Excellent diagrams show the reader to establish and measure the all-importa
You easily download any file type for your device.Defect analysis in electron microscopy | M. H Loretto. I really enjoyed this book and have already told so many people about it!
