[PDF.48dp] Electron Microscopy and Analysis 2001 (Institute of Physics Conference Series)

Electron Microscopy and Analysis 2001 (Institute of Physics Conference Series)

[PDF.at14] Electron Microscopy and Analysis 2001 (Institute of Physics Conference Series)

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 | #17348441 in Books |  CRC Press |  2001-12-01 | Original language:English | PDF # 1 |  9.20 x1.40 x6.10l,2.05 | File type: PDF | 529 pages

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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the sta...

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