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| #4948338 in Books | Springer | 2013-03-12 | Original language:English | PDF # 1 | 9.21 x1.56 x6.14l,2.63 | File type: PDF | 730 pages | |
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal o...
You can specify the type of files you want, for your device.Ellipsometry at the Nanoscale | From Brand: Springer. I was recommended this book by a dear friend of mine.