[PDF.56gb] Noncontact Atomic Force Microscopy (NanoScience and Technology)

Noncontact Atomic Force Microscopy (NanoScience and Technology)

[PDF.rc37] Noncontact Atomic Force Microscopy (NanoScience and Technology)

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 |  Springer |  2012-10-23 |  2002-07-24 | Original language:English | PDF # 1 |  9.25 x1.08 x6.10l,.0 | File type: PDF | 440 pages

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mec...

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