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Noncontact Atomic Force Microscopy
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| #6600522 in Books | Springer | 2002-09-17 | Original language:English | PDF # 1 | 9.21 x1.00 x6.14l,1.69 | File type: PDF | 440 pages | |
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mec...
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