[PDF.12sp] Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R.F. Egerton
[PDF.ik84] Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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| #2768869 in Books | 2011-02-11 | Original language:English | PDF # 1 | 9.21 x.56 x6.14l,.95 | File type: PDF | 202 pages|
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of l...
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