[PDF.64ew] Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
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Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
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| #3981111 in Books | 1975-04-01 | Original language:English | PDF # 1 | 9.00 x6.50 x1.25l,.0 | File type: PDF | 582 pages||0 of 0 people found the following review helpful.| Five Stars|By Madtown Magma Man|Excellent.
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were ...
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