[PDF.67gl] Scanning Microscopy for Nanotechnology: Techniques and Applications
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Scanning Microscopy for Nanotechnology: Techniques and Applications
From Weilie Zhou
[PDF.om99] Scanning Microscopy for Nanotechnology: Techniques and Applications
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| #2559832 in Books | Weilie Zhou | 2006-11-27 | Original language:English | PDF # 1 | 9.21 x1.19 x6.14l,2.31 | File type: PDF | 522 pages | Scanning Microscopy for Nanotechnology Techniques and Applications|
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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