[PDF.59fx] Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
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Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
Wai Kin Chim
[PDF.db27] Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
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| #4995786 in Books | 2000-12-13 | Original language:English | PDF # 1 | 9.31 x.78 x6.28l,1.69 | File type: PDF | 288 pages|
The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference: * Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and...
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