[PDF.84ip] Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings)

Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings)

[PDF.rf83] Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings)

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 | #7394513 in Books |  2001-08-02 | Original language:English | PDF # 1 |  9.40 x.90 x6.50l,1.36 | File type: PDF | 318 pages

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This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.

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